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Reliability Wearout Mechanisms in Advanced CMOS Technologies - Alvin W. Strong, Ernest Y. Wu, Rolf-Peter Vollertsen, Jordi Suné, Giuseppe LaRosa, Stewart E. Rauch, III, Timothy D. Sullivan
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Alvin W. Strong, Ernest Y. Wu, Rolf-Peter Vollertsen, Jordi Suné, Giuseppe LaRosa, Stewart E. Rauch, III, Timothy D. Sullivan:

Reliability Wearout Mechanisms in Advanced CMOS Technologies - copertina rigida, flessible

2009, ISBN: 9780471731726

It is the first book of its kind to bring together the pertinent physics, equations, and procedures for CMOS technology reliability in one place. Divided into six relatively independent t… Altro …

100.0, Zahlungsarten: Paypal, APPLE_PAY, Google Pay, Visa, Mastercard, American Express. Costi di spedizione:Versand zum Fixpreis, [SHT: Standardversand], 22*** Hamburg, [TO: Weltweit] (EUR 5.50) booksof_22
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Reliability Wearout Mechanisms in Advanced CMOS Technologies - Strong, Alvin W.|Wu, Ernest Y.|Vollertsen, Rolf-Peter|Sune, Jordi|La Rosa, Giuseppe|Sullivan, Timothy D.|Rauch, Stewart E.
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Strong, Alvin W.|Wu, Ernest Y.|Vollertsen, Rolf-Peter|Sune, Jordi|La Rosa, Giuseppe|Sullivan, Timothy D.|Rauch, Stewart E.:

Reliability Wearout Mechanisms in Advanced CMOS Technologies - copertina rigida, flessible

2009, ISBN: 0471731722

[EAN: 9780471731726], Neubuch, [PU: Wiley & Sons|Wiley-IEEE Press], TECHNOLOGY & INDUSTRIAL ARTS ENGINEERING ELECTRICAL TECHNIK ELEKTRONIK ELEKTROTECHNIK NACHRICHTENTECHNIK TECHNISCHE ZUV… Altro …

NEW BOOK. Costi di spedizione:Versandkostenfrei. (EUR 0.00) moluna, Greven, Germany [73551232] [Rating: 5 (von 5)]
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Reliability Wearout Mechanisms in Advanced CMOS Technologies - Alvin W. Strong Ernest Y. Wu Rolf-Peter Vollertsen Jordi Sune Giuseppe La Rosa Timothy D. Sullivan Stewart E. Rauch
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Alvin W. Strong Ernest Y. Wu Rolf-Peter Vollertsen Jordi Sune Giuseppe La Rosa Timothy D. Sullivan Stewart E. Rauch:
Reliability Wearout Mechanisms in Advanced CMOS Technologies - Prima edizione

2009

ISBN: 9780471731726

edizione con copertina rigida

[ED: Gebunden], [PU: John Wiley & Sons], ALVIN W. STRONG, PhD, is retired from IBM in Essex Junction, Vermont. He holds nineteen patents, has authored or coauthored a number of papers, an… Altro …

Costi di spedizione:Versandkostenfrei, Versand nach Deutschland. (EUR 0.00) Moluna GmbH
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Strong, Alvin W, and Wu, Ernest Y, and Vollertsen, Rolf-Peter:
Reliability Wearout Mechanisms in Advanced Cmos Technologies - copertina rigida, flessible

2009, ISBN: 9780471731726

Hard cover, New Book Original US edition, Perfect Condition. Printed in English. Excellent Quality, Service and customer satisfaction guaranteed., Brand New, [PU: Wiley-IEEE Press]

IND - IndiaCosti di spedizione:Costi di spedizione aggiuntivi New Delhi, NEW DELHI, Firstbookstore
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Reliability Wearout Mechanisms in Advanced CMOS Technologies - Alvin W. Strong; Ernest Y. Wu; Rolf-Peter Vollertsen; Jordi Sune; Giuseppe La Rosa
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Alvin W. Strong; Ernest Y. Wu; Rolf-Peter Vollertsen; Jordi Sune; Giuseppe La Rosa:
Reliability Wearout Mechanisms in Advanced CMOS Technologies - copertina rigida, flessible

2009, ISBN: 9780471731726

Buch, Hardcover, [PU: Wiley-IEEE Press], Wiley-IEEE Press, 2009

Costi di spedizione:Versand in 10-15 Tagen. (EUR 0.00)

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Reliability Wearout Mechanisms in Advanced CMOS Technologies

A comprehensive treatment of all aspects of CMOS reliability wearout mechanisms This book covers everything students and professionals need to know about CMOS reliability wearout mechanisms, from basic concepts to the tools necessary to conduct reliability tests and analyze the results. It is the first book of its kind to bring together the pertinent physics, equations, and procedures for CMOS technology reliability in one place. Divided into six relatively independent topics, the book covers: * Introduction to Reliability * Gate Dielectric Reliability * Negative Bias Temperature Instability * Hot Carrier Injection * Electromigration Reliability * Stress Voiding Chapters conclude with practical appendices that provide very basic experimental procedures for readers who are conducting reliability experiments for the first time. Reliability Wearout Mechanisms in Advanced CMOS Technologies is ideal for students and new engineers who are looking to gain a working understanding of CMOS technology reliability. It is also suitable as a professional reference for experienced circuit design engineers, device design engineers, and process engineers.

Informazioni dettagliate del libro - Reliability Wearout Mechanisms in Advanced CMOS Technologies


EAN (ISBN-13): 9780471731726
ISBN (ISBN-10): 0471731722
Copertina rigida
Copertina flessibile
Anno di pubblicazione: 2009
Editore: Wiley-IEEE Press
624 Pagine
Peso: 0,980 kg
Lingua: eng/Englisch

Libro nella banca dati dal 2007-07-05T07:08:40+02:00 (Zurich)
Pagina di dettaglio ultima modifica in 2024-03-08T15:28:43+01:00 (Zurich)
ISBN/EAN: 9780471731726

ISBN - Stili di scrittura alternativi:
0-471-73172-2, 978-0-471-73172-6
Stili di scrittura alternativi e concetti di ricerca simili:
Autore del libro : rosa peter, guiseppe, peter rauch, stewart, peter spain, rosa giuseppe, vollertsen rolf, volle, strong, vollert
Titolo del libro: cmos technologie, reliability for the technologies, series advanced, reliability wearout mechanisms advanced cmos technologies


Dati dell'editore

Autore: Alvin W. Strong; Ernest Y. Wu; Rolf-Peter Vollertsen; Jordi Sune; Giuseppe La Rosa; Timothy D. Sullivan; Stewart E. Rauch
Titolo: IEEE Press Series on Microelectronic Systems; Reliability Wearout Mechanisms in Advanced CMOS Technologies
Editore: John Wiley & Sons
624 Pagine
Anno di pubblicazione: 2009-09-04
Peso: 0,966 kg
Lingua: Inglese
165,00 € (DE)
No longer receiving updates
164mm x 238mm x 33mm

BB; gebunden; Hardcover, Softcover / Technik/Elektronik, Elektrotechnik, Nachrichtentechnik; Schaltkreise und Komponenten (Bauteile); Quality & Reliability; Schaltkreise - Theorie u. Entwurf; Circuit Theory & Design; Qualität u. Zuverlässigkeit; Schaltkreise - Theorie u. Entwurf / VLSI / ULSI; Electrical & Electronics Engineering; CMOS; Schaltkreistechnik; Circuit Theory & Design / VLSI / ULSI; Technische Zuverlässigkeit; Elektrotechnik u. Elektronik; Qualität u. Zuverlässigkeit; Schaltkreise - Theorie u. Entwurf; Schaltkreise - Theorie u. Entwurf / VLSI / ULSI

A comprehensive treatment of all aspects of CMOS reliability wearout mechanisms This book covers everything students and professionals need to know about CMOS reliability wearout mechanisms, from basic concepts to the tools necessary to conduct reliability tests and analyze the results. It is the first book of its kind to bring together the pertinent physics, equations, and procedures for CMOS technology reliability in one place. Divided into six relatively independent topics, the book covers: * Introduction to Reliability * Gate Dielectric Reliability * Negative Bias Temperature Instability * Hot Carrier Injection * Electromigration Reliability * Stress Voiding Chapters conclude with practical appendices that provide very basic experimental procedures for readers who are conducting reliability experiments for the first time. Reliability Wearout Mechanisms in Advanced CMOS Technologies is ideal for students and new engineers who are looking to gain a working understanding of CMOS technology reliability. It is also suitable as a professional reference for experienced circuit design engineers, device design engineers, and process engineers.

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