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Design, Modeling and Control of Nanopositioning Systems - Kam K. Leang
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Design, Modeling and Control of Nanopositioning Systems - copertina rigida, flessible

2014, ISBN: 3319066161

[EAN: 9783319066165], Neubuch, [SC: 0.0], [PU: Springer International Publishing], DAMPINGCONTROL; FEEDFORWARDCONTROL; HYSTERESIS; PIEZOELECTRICACTUATORS; TRACKINGCONTROL; SCANNINGPROBEMI… Altro …

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Design, Modeling and Control of Nanopositioning Systems (Advances in Industrial Control) - Fleming Andrew, J. und K. Leang Kam,
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Fleming Andrew, J. und K. Leang Kam,:

Design, Modeling and Control of Nanopositioning Systems (Advances in Industrial Control) - copertina rigida, flessible

2014, ISBN: 3319066161

[EAN: 9783319066165], [SC: 3.0], [PU: Springer], DAMPING CONTROL,FEED FORWARD CONTROL,SCANNING PROBE MICROSCOPES,PIEZOELECTRIC ACTUATORS,TRACKING CONTROL,NANOPOSITIONING,FLEXURE DESIGN,PR… Altro …

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Design, Modeling and Control of Nanopositioning Systems (Advances in Industrial Control) 2014 - Fleming Andrew, J. und K. Leang Kam,
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Design, Modeling and Control of Nanopositioning Systems (Advances in Industrial Control) 2014 - copertina rigida, flessible

2014

ISBN: 9783319066165

2014 411 Seiten Gebundene Ausgabe, Größe: 15.2 x 2.8 x 23.4 cm Buch in neuwertigem Zustand. Wirkt unbenutzt. Lediglich Mini-BibSignatur auf Buchrücken und Barcode auf Vorsatz. 97833190661… Altro …

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Design, Modeling and Control of Nanopositioning Systems (Advances in Industrial Control) - Fleming Andrew, J. und K. Leang Kam,
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Fleming Andrew, J. und K. Leang Kam,:
Design, Modeling and Control of Nanopositioning Systems (Advances in Industrial Control) - copertina rigida, flessible

2014, ISBN: 3319066161

2014 Gebundene Ausgabe, Größe: 15.2 x 2.8 x 23.4 cm 411 Seiten Gebundene Ausgabe Buch in neuwertigem Zustand. Wirkt unbenutzt. Lediglich Mini-BibSignatur auf Buchrücken und Barcode auf V… Altro …

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Design, Modeling and Control of Nanopositioning Systems - Andrew J. Fleming; Kam K. Leang
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Andrew J. Fleming; Kam K. Leang:
Design, Modeling and Control of Nanopositioning Systems - Prima edizione

2014, ISBN: 9783319066165

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Buch, Hardcover, 2014, [PU: Springer International Publishing], Springer International Publishing, 2014

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Dettagli del libro
Design, Modeling and Control of Nanopositioning Systems
Autore:
Titolo:
ISBN:

9783319066165


Covering the complete design cycle of nanopositioning systems, this is the first comprehensive text on the topic. The book first introduces concepts associated with nanopositioning stages and outlines their application in such tasks as scanning probe microscopy, nanofabrication, data storage, cell surgery and precision optics. Piezoelectric transducers, employed ubiquitously in nanopositioning applications are then discussed in detail including practical considerations and constraints on transducer response. The reader is then given an overview of the types of nanopositioner before the text turns to the in-depth coverage of mechanical design including flexures, materials, manufacturing techniques, and electronics. This process is illustrated by the example of a high-speed serial-kinematic nanopositioner. Position sensors are then catalogued and described and the text then focuses on control. Several forms of control are treated: shunt control, feedback control, force feedback control and feedforward control (including an appreciation of iterative learning control). Performance issues are given importance as are problems limiting that performance such as hysteresis and noise which arise in the treatment of control and are then given chapter-length attention in their own right. The reader also learns about cost functions and other issues involved in command shaping, charge drives and electrical considerations. All concepts are demonstrated experimentally including by direct application to atomic force microscope imaging. Design, Modeling and Control of Nanopositioning Systems will be of interest to researchers in mechatronics generally and in control applied to atomic force microscopy and other nanopositioning applications. Microscope developers and mechanical designers of nanopositioning devices will find the text essential reading.

Informazioni dettagliate del libro - Design, Modeling and Control of Nanopositioning Systems


EAN (ISBN-13): 9783319066165
ISBN (ISBN-10): 3319066161
Copertina rigida
Copertina flessibile
Anno di pubblicazione: 2014
Editore: Springer International Publishing

Libro nella banca dati dal 2014-07-28T02:08:12+02:00 (Zurich)
Pagina di dettaglio ultima modifica in 2024-01-31T15:30:32+01:00 (Zurich)
ISBN/EAN: 9783319066165

ISBN - Stili di scrittura alternativi:
3-319-06616-1, 978-3-319-06616-5
Stili di scrittura alternativi e concetti di ricerca simili:
Autore del libro : fleming, andrew lea, kam
Titolo del libro: nano, industrial design, kam, modelling control design, modeling control design

Dati dell'editore

Autore: Andrew J. Fleming; Kam K. Leang
Titolo: Advances in Industrial Control; Design, Modeling and Control of Nanopositioning Systems
Editore: Springer; Springer International Publishing
411 Pagine
Anno di pubblicazione: 2014-06-03
Cham; CH
Stampato / Fatto in
Lingua: Inglese
160,49 € (DE)
164,99 € (AT)
177,00 CHF (CH)
POD
XVI, 411 p. 261 illus., 180 illus. in color.

BB; Hardcover, Softcover / Technik/Elektronik, Elektrotechnik, Nachrichtentechnik; Regelungstechnik; Verstehen; Damping Control; Feed Forward Control; Flexure Design; Hysteresis; Nanopositioning; Piezoelectric Actuators; Position Sensors; Precision Motion Control; Scanning Probe Microscopes; Tracking Control; Control and Systems Theory; Mechatronics; Machines, Tools, Processes; Industrial and Production Engineering; Elektronik; Maschinenbau; Fertigungstechnik und Ingenieurwesen; EA; BC

Covering the complete design cycle of nanopositioning systems, this is the first comprehensive text on the topic. The book first introduces concepts associated with nanopositioning stages and outlines their application in such tasks as scanning probe microscopy, nanofabrication, data storage, cell surgery and precision optics. Piezoelectric transducers, employed ubiquitously in nanopositioning applications are then discussed in detail including practical considerations and constraints on transducer response. The reader is then given an overview of the types of nanopositioner before the text turns to the in-depth coverage of mechanical design including flexures, materials, manufacturing techniques, and electronics. This process is illustrated by the example of a high-speed serial-kinematic nanopositioner. Position sensors are then catalogued and described and the text then focuses on control.Several forms of control are treated: shunt control, feedback control, force feedback control and feedforward control (including an appreciation of iterative learning control). Performance issues are given importance as are problems limiting that performance such as hysteresis and noise which arise in the treatment of control and are then given chapter-length attention in their own right. The reader also learns about cost functions and other issues involved in command shaping, charge drives and electrical considerations. All concepts are demonstrated experimentally including by direct application to atomic force microscope imaging.Design, Modeling and Control of Nanopositioning Systems will be of interest to researchers in mechatronics generally and in control applied to atomic force microscopy and other nanopositioning applications. Microscope developers and mechanical designers of nanopositioning devices will find the text essential reading.Advances in Industrial Control aims to report and encourage the transfer of technology incontrol engineering. The rapid development of control technology has an impact on all areas of the control discipline. The series offers an opportunity for researchers to present an extended exposition of new work in all aspects of industrial control.
Enriches understanding of precision control theory Explains the complete process of nanopositioning control including practical difficulties and their solution Reinforces basic principles with experimental application in atomic force microscope
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