Transmission Electron Microscopy. A Textbook for Materials Science. Bd. I - IV - edizione con copertina flessibile
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Transmission Electron Microscopy: A Textbook for Materials Science (4-Vol Set) - edizione con copertina flessibile
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Transmission Electron Microscopy. A Textbook for Materials Science. Bd. I - IV - edizione con copertina flessibile
ISBN: 030645324X
[SR: 477277], Taschenbuch, [EAN: 9780306453243], Springer, Springer, Book, [PU: Springer], Springer, 403432, Schule & Lernen, 405500, Allgemeinbildung, 14025941, Berufs- & Fachschulbücher… Altro …
David B. Williams, C. Barry Carter:
Transmission Electron Microscopy: A Textbook for Materials Science (4-Vol Set) - edizione con copertina flessibileISBN: 9780306453243
by Williams, David B.; Carter, C.... | PB | Acceptable, Transmission Electron Microscopy: A Textbook for Materials Science (4-Vol Set) by Williams, David B.; Carter, C. Barry Readable cop… Altro …
ISBN: 9780306453243
A digital copy of "Transmission Electron Microscopy I-IV : A Textbook for Materials Science" by David B. Williams and C. Barry Carter. Download is immediately available upon purchase! 978… Altro …
Transmission Electron Microscopy: A Textbook for Materials Science (4-Vol Set) - edizione con copertina flessibile
2004, ISBN: 030645324X
[EAN: 9780306453243], Used, very good, [PU: Springer], Books
2004, ISBN: 030645324X
[EAN: 9780306453243], [PU: Springer], pp. 703, Books
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Informazioni dettagliate del libro - Transmission Electron Microscopy. A Textbook for Materials Science. Bd. I - IV
EAN (ISBN-13): 9780306453243
ISBN (ISBN-10): 030645324X
Copertina flessibile
Anno di pubblicazione: 1996
Editore: Springer
703 Pagine
Peso: 1,964 kg
Lingua: eng/Englisch
Libro nella banca dati dal 2007-04-24T01:18:06+02:00 (Zurich)
Pagina di dettaglio ultima modifica in 2024-03-18T18:04:53+01:00 (Zurich)
ISBN/EAN: 030645324X
ISBN - Stili di scrittura alternativi:
0-306-45324-X, 978-0-306-45324-3
Stili di scrittura alternativi e concetti di ricerca simili:
Autore del libro : david carter, carter william, carter barry, williams and carter
Titolo del libro: transmission electron microscopy textbook for materials science
Dati dell'editore
Autore: David B. Williams; C. Barry Carter
Titolo: Transmission Electron Microscopy - A Textbook for Materials Science
Editore: Springer; Springer US
729 Pagine
Anno di pubblicazione: 2004-08-31
New York; NY; US
Stampato / Fatto in
Peso: 1,840 kg
Lingua: Inglese
85,59 € (DE)
87,99 € (AT)
106,60 CHF (CH)
Not available, publisher indicates OP
BC; Book; Hardcover, Softcover / Physik, Astronomie/Mechanik, Akustik; Spektroskopie, Spektrochemie, Massenspektrometrie; electron microscope; electron microscopy; diffraction; crystal; microscopy; transmission electron microscopy; Helium-Atom-Streuung; materials characterization; B; Physics and Astronomy; Spectroscopy and Microscopy; Surface and Interface Science, Thin Films; Solid State Physics; Characterization and Evaluation of Materials; Biological Microscopy; Wissenschaftliche Ausstattung, Experimente und Techniken; Physik der kondensierten Materie (Flüssigkeits- und Festkörperphysik); Spektroskopie, Spektrochemie, Massenspektrometrie; Werkstoffprüfung; Biologie, Biowissenschaften; Wissenschaftliche Ausstattung, Experimente und Techniken; BB; BC
Basics: 1. The Transmission Electron Microscope. 2. Scattering and Diffraction. 3. Elastic Scattering. 4. Inelastic Scattering and Beam Damage. 5. Electron Sources. 6. Lenses, Apertures, and Resolution 7. How to `See' Electrons. 8. Pumps and Holders. 9. The Instrument 10. Specimen Preparation. Diffraction: 11. Diffraction Patterns. 12. Thinking in Reciprocal Space 13. Diffracted Beams. 14. Bloch Waves. 15. Dispersion Surfaces. 16. Diffraction from Crystals. 17. Diffraction from Small Volumes. 18. Indexing Diffraction Patterns. 19. Kikuchi Diffraction. 20. Obtaining CBED Patterns. 21. Using Covergent-Beam Technologies. Imaging: 22. Imaging in the TEM. 23. Thickness and Bending Effects. 24. Planar Defects. 25. Strain Fields. 26. WeakBeam Dark-Field Microscopy. 27. Phase-Contrast Images. 28. High-Resolution TEM. 29. Image Simulation. 30. Quantifying and Processing HRTEM Images. 31. Other Imaging Techniques. Spectrometry: 32. Xray Spectrometry. 33. The XEDS-TEM Interface. 34. Qualitative Xray Analysis. 35. Quantitative Xray Microanalysis. 36. Spatial Resolution and Minimum Detectability. 37. Electron EnergyLoss Spectrometers. 38. The EnergyLoss Spectrum. 39. Microanalysis with Ionization-Loss Electrons. 40. Everything Else in the Spectrum. Index.Altri libri che potrebbero essere simili a questo:
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