Testing, Reliability, and Applications of Optoelectronic Devices (SPIE Proceedings Volume 4285) - edizione con copertina flessibile
2001, ISBN: 0819439630
[EAN: 9780819439635], [PU: SPIE], OPTICAL OPTOELECTRONIC DEVICES MEDICAL MEDICINE, Technology|Electronics|Optoelectronics, Technology|General, 0819439630 | Yellow covers. Clean pages, tig… Altro …
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Testing, Reliability, and Applications of Optoelectronic Devices (Spie Proceedings Volume 4285) - edizione con copertina flessibile
2001, ISBN: 9780819439635
Soft cover, 4to-over 9¾-12" tall, Very Good Ex-Library Condition, General #1|OPTICAL OPTOELECTRONIC DEVICES MEDICAL MEDICINE, 0819439630 | Yellow covers. Clean pages, tight binding. Card … Altro …
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Testing Reliability and Application: 24-26 January, 2001, San Jose, California USA (Proceedings of Spie--the International Society for Optical Engineering, V. 4285.) - edizione con copertina flessibile
2001, ISBN: 9780819439635
SPIE-International Society for Optical Engine, 2001-05. Paperback. Good., SPIE-International Society for Optical Engine, 2001-05
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ISBN: 9780819439635
Testing, Reliability, and Applications of Optoelectronic Devices Testing-Reliability-and-Applications-of-Optoelectronic-Devices~~Aland-K-Chin Undefined>Undefined>Undefined Hardcover, SPIE… Altro …
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Testing, Reliability, and Applications of Optoelectronic Devices (SPIE Proceedings Volume 4285) - edizione con copertina flessibile
2001, ISBN: 0819439630
[EAN: 9780819439635], [PU: SPIE], OPTICAL OPTOELECTRONIC DEVICES MEDICAL MEDICINE, Technology|Electronics|Optoelectronics, Technology|General, 0819439630 | Yellow covers. Clean pages, tig… Altro …
Chin, Alan K.; Wang, S. C.; Dutta, Niloy K.; Linden, Kurt J.:
Testing, Reliability, and Applications of Optoelectronic Devices (Spie Proceedings Volume 4285) - edizione con copertina flessibile2001, ISBN: 9780819439635
Soft cover, 4to-over 9¾-12" tall, Very Good Ex-Library Condition, General #1|OPTICAL OPTOELECTRONIC DEVICES MEDICAL MEDICINE, 0819439630 | Yellow covers. Clean pages, tight binding. Card … Altro …
Testing Reliability and Application: 24-26 January, 2001, San Jose, California USA (Proceedings of Spie--the International Society for Optical Engineering, V. 4285.) - edizione con copertina flessibile
2001
ISBN: 9780819439635
SPIE-International Society for Optical Engine, 2001-05. Paperback. Good., SPIE-International Society for Optical Engine, 2001-05
ISBN: 9780819439635
Testing, Reliability, and Applications of Optoelectronic Devices Testing-Reliability-and-Applications-of-Optoelectronic-Devices~~Aland-K-Chin Undefined>Undefined>Undefined Hardcover, SPIE… Altro …
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Informazioni dettagliate del libro - Testing, Reliability, and Applications of Optoelectronic Devices
EAN (ISBN-13): 9780819439635
ISBN (ISBN-10): 0819439630
Copertina rigida
Copertina flessibile
Anno di pubblicazione: 2001
Editore: SPIE Press
Libro nella banca dati dal 2007-10-16T15:34:05+02:00 (Zurich)
Pagina di dettaglio ultima modifica in 2018-07-19T04:14:04+02:00 (Zurich)
ISBN/EAN: 0819439630
ISBN - Stili di scrittura alternativi:
0-8194-3963-0, 978-0-8194-3963-5
Stili di scrittura alternativi e concetti di ricerca simili:
Autore del libro : linden, kurt aland
Titolo del libro: optoelectronic devices
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