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2010, ISBN: 9781441909282
eBooks, eBook Download (PDF), 2010, Managing the power consumption of circuits and systems is now considered one of the most important challenges for the semiconductor industry. Elaborate… Altro …
ISBN: 9781441909282
*Power-Aware Testing and Test Strategies for Low Power Devices* / pdf eBook für 106.99 € / Aus dem Bereich: eBooks, Sachthemen & Ratgeber, Computer & Internet Medien > Bücher nein eBook a… Altro …
ISBN: 9781441909282
; PDF; Scientific, Technical and Medical > Electronics & communications engineering > Electronics engineeri, Cambridge Scholars Publishing
2010, ISBN: 9781441909282
eBooks, eBook Download (PDF), 2010, [PU: Springer US], Springer US, 2010
2010, ISBN: 9781441909282
2010, eBook Download (PDF), eBooks, [PU: Springer US]
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Informazioni dettagliate del libro - Power-Aware Testing and Test Strategies for Low Power Devices
EAN (ISBN-13): 9781441909282
ISBN (ISBN-10): 1441909281
Anno di pubblicazione: 2010
Editore: Springer-Verlag GmbH
353 Pagine
Lingua: eng/Englisch
Libro nella banca dati dal 2011-10-05T20:05:02+02:00 (Zurich)
Pagina di dettaglio ultima modifica in 2023-06-15T09:53:26+02:00 (Zurich)
ISBN/EAN: 1441909281
ISBN - Stili di scrittura alternativi:
1-4419-0928-1, 978-1-4419-0928-2
Stili di scrittura alternativi e concetti di ricerca simili:
Autore del libro : girard patrick, xiaoqi
Titolo del libro: test
Dati dell'editore
Autore: Patrick Girard; Nicola Nicolici; Xiaoqing Wen
Titolo: Power-Aware Testing and Test Strategies for Low Power Devices
Editore: Springer; Springer US
363 Pagine
Anno di pubblicazione: 2010-03-11
New York; NY; US
Lingua: Inglese
106,99 € (DE)
110,00 € (AT)
130,00 CHF (CH)
Available
XXI, 363 p.
EA; E107; eBook; Nonbooks, PBS / Technik/Elektronik, Elektrotechnik, Nachrichtentechnik; Schaltkreise und Komponenten (Bauteile); Verstehen; Electronic Testing; Low Power Design; Low Power Testing; Nanoscale Testing; Nicolici; Power Aware Testing; Semiconductor Testing; VLSI; Wen; power management; semiconductor; testing; B; Electronic Circuits and Systems; Computer-Aided Engineering (CAD, CAE) and Design; Engineering; Computer-Aided Design (CAD); BB
Fundamentals of VLSI Testing.- Power Issues During Test.- Low-Power Test Pattern Generation.- Power-Aware Design-for-Test.- Power-Aware Test Data Compression and BIST.- Power-Aware System-Level Test Planning.- Low-Power Design Techniques and Test Implications.- Test Strategies for Multivoltage Designs.- Test Strategies for Gated Clock Designs.- Test of Power Management Structures.- EDA Solution for Power-Aware Design-for-Test.Is the only comprehensive book on power-aware test for (low power) circuits and systems Instructs readers how low-power devices can be tested safely without affecting yield and reliability Includes necessary background information on design for test and low-power design Incorporates detailed coverage of all levels of abstraction for power-aware testing of (low-power) circuits and systems Presents state-of-the-art industrial practices and EDA solutions Includes supplementary material: sn.pub/extras
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