ISBN: 9781441960870
This two-volume Handbook is a comprehensive guide to sample preparation for the transmission electron microscope. The first volume covers general theoretical and practical aspects of the … Altro …
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ISBN: 9781441960870
This two-volume Handbook is a comprehensive guide to sample preparation for the transmission electron microscope. The first volume covers general theoretical and practical aspects of the … Altro …
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2010, ISBN: 9781441960870
Buch, [PU: Springer-Verlag New York Inc.], Springer-Verlag New York Inc., 2010
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2010, ISBN: 9781441960870
Buch, [PU: Springer-Verlag New York Inc.], Springer-Verlag New York Inc., 2010
lehmanns.de Costi di spedizione:Versand in 7-10 Tagen. (EUR 0.00) Details... |
2010, ISBN: 9781441960870
Springer, 2010-07-09. 2010. Hardcover. Used:Good., Springer, 2010-07-09, 0
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ISBN: 9781441960870
This two-volume Handbook is a comprehensive guide to sample preparation for the transmission electron microscope. The first volume covers general theoretical and practical aspects of the … Altro …
ISBN: 9781441960870
This two-volume Handbook is a comprehensive guide to sample preparation for the transmission electron microscope. The first volume covers general theoretical and practical aspects of the … Altro …
2010
ISBN: 9781441960870
Buch, [PU: Springer-Verlag New York Inc.], Springer-Verlag New York Inc., 2010
2010, ISBN: 9781441960870
Buch, [PU: Springer-Verlag New York Inc.], Springer-Verlag New York Inc., 2010
2010, ISBN: 9781441960870
Springer, 2010-07-09. 2010. Hardcover. Used:Good., Springer, 2010-07-09, 0
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Informazioni dettagliate del libro - Sample Preparation Handbook for Transmission Electron Microscopy
EAN (ISBN-13): 9781441960870
ISBN (ISBN-10): 1441960872
Copertina rigida
Copertina flessibile
Anno di pubblicazione: 2010
Editore: Springer-Verlag New York Inc.
670 Pagine
Peso: 1,245 kg
Lingua: eng/Englisch
Libro nella banca dati dal 2009-02-02T07:52:21+01:00 (Zurich)
Pagina di dettaglio ultima modifica in 2023-09-28T04:08:31+02:00 (Zurich)
ISBN/EAN: 1441960872
ISBN - Stili di scrittura alternativi:
1-4419-6087-2, 978-1-4419-6087-0
Stili di scrittura alternativi e concetti di ricerca simili:
Autore del libro : ayache, ehret, luc, jacqueline, ayach, gabrielle, beaunier, gabriel laub
Titolo del libro: transmission, electron microscopy, handbook sample preparation
Dati dell'editore
Autore: Jeanne Ayache; Luc Beaunier; Jacqueline Boumendil; Gabrielle Ehret; Danièle Laub
Titolo: Sample Preparation Handbook for Transmission Electron Microscopy
Editore: Springer; Springer US
670 Pagine
Anno di pubblicazione: 2010-07-09
New York; NY; US
Lingua: Inglese
160,49 € (DE)
164,99 € (AT)
177,00 CHF (CH)
Available
670 p. 2 volume-set.
BA; Characterization and Evaluation of Materials; Hardcover, Softcover / Technik/Maschinenbau, Fertigungstechnik; Werkstoffprüfung; Verstehen; Biological Microscopy; Biological Microscopy; Mineralogy; Nanotechnology; Characterization and Analytical Technique; Bioanalysis and Bioimaging; Mineralogy; Nanotechnology; Biophysik; Petrologie (Gesteinskunde), Petrografie und Mineralogie; Nanotechnologie
Introduction to materials.- The different observation modes in electron microscopy (SEM, TEM, STEM).- Materials problems and approaches for TEM and TEM/STEM analyses.- Physical and chemical mechanisms of preparation techniques.- Artifacts in transmission electron microscopy.- Selection of preparation techniques based on materials problems and TEM analyses.- Comparisons between techniques.-
Introduction.- Preliminary preparation techniques.- Thinning preparation techniques.- Mechanical preparation techniques.- Replica techniques.- Techniques specific to fine particles.- Contrast-enhancement and labeling techniques.-
First book on TEM sample preparation to combine all the most current techniques for applications ranging from minerals to biological materials
Compares techniques in terms of their limitations, artefacts, application areas, and types of analysis (macroscopic, atomic, or molecular level)
Describes physical characteristics, chemistry, structure/texture, and orientation properties of materials in relation to the most appropriate type of TEM analysis
Complementary interactive database website is available to scientists worldwide
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