ISBN: 9781461422693
This book targets custom IC designers who are encountering variation issues in their designs, especially for modern process nodes at 45nm and below, such as statistical process variations… Altro …
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ISBN: 9781461422693
This book targets custom IC designers who are encountering variation issues in their designs, especially for modern process nodes at 45nm and below, such as statistical process variations… Altro …
| Springer.com Nr. 978-1-4614-2269-3. Costi di spedizione:Worldwide free shipping, , DE. (EUR 0.00) Details... |
ISBN: 9781461422693
This book targets custom IC designers who are encountering variation issues in their designs, especially for modern process nodes at 45nm and below. It sets out state-of-the-art variation… Altro …
| hive.co.uk No. 9781461422693. Costi di spedizione:Instock, Despatched same working day before 3pm, zzgl. Versandkosten., Costi di spedizione aggiuntivi Details... |
ISBN: 9781461422693
Variation-Aware Design of Custom Integrated Circuits: A Hands-on Field Guide: ab 96.49 € eBooks > Sachthemen & Ratgeber > Technik Springer-Verlag GmbH, Springer-Verlag GmbH
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2012, ISBN: 9781461422693
eBooks, eBook Download (PDF), 2012, [PU: Springer New York], Springer New York, 2012
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ISBN: 9781461422693
This book targets custom IC designers who are encountering variation issues in their designs, especially for modern process nodes at 45nm and below, such as statistical process variations… Altro …
ISBN: 9781461422693
This book targets custom IC designers who are encountering variation issues in their designs, especially for modern process nodes at 45nm and below, such as statistical process variations… Altro …
ISBN: 9781461422693
This book targets custom IC designers who are encountering variation issues in their designs, especially for modern process nodes at 45nm and below. It sets out state-of-the-art variation… Altro …
ISBN: 9781461422693
Variation-Aware Design of Custom Integrated Circuits: A Hands-on Field Guide: ab 96.49 € eBooks > Sachthemen & Ratgeber > Technik Springer-Verlag GmbH, Springer-Verlag GmbH
2012, ISBN: 9781461422693
eBooks, eBook Download (PDF), 2012, [PU: Springer New York], Springer New York, 2012
Dati bibliografici del miglior libro corrispondente
Informazioni dettagliate del libro - Variation-Aware Design of Custom Integrated Circuits: A Hands-on Field Guide
EAN (ISBN-13): 9781461422693
ISBN (ISBN-10): 1461422698
Anno di pubblicazione: 2012
Editore: Springer New York
188 Pagine
Lingua: eng/Englisch
Libro nella banca dati dal 2012-05-26T05:47:47+02:00 (Zurich)
Pagina di dettaglio ultima modifica in 2024-03-13T09:26:26+01:00 (Zurich)
ISBN/EAN: 1461422698
ISBN - Stili di scrittura alternativi:
1-4614-2269-8, 978-1-4614-2269-3
Stili di scrittura alternativi e concetti di ricerca simili:
Autore del libro : dyck, kristopher, amit, kristo, gupta gupta, moorhead, rinehart, mcconaghy
Titolo del libro: field guide, hand, few hands, variation, integrated circuits
Dati dell'editore
Autore: Trent McConaghy; Kristopher Breen; Jeffrey Dyck; Amit Gupta
Titolo: Variation-Aware Design of Custom Integrated Circuits: A Hands-on Field Guide
Editore: Springer; Springer US
188 Pagine
Anno di pubblicazione: 2012-10-02
New York; NY; US
Stampato / Fatto in
Lingua: Inglese
96,29 € (DE)
99,00 € (AT)
106,50 CHF (CH)
Available
XVI, 188 p.
EA; E107; eBook; Nonbooks, PBS / Technik/Elektronik, Elektrotechnik, Nachrichtentechnik; Schaltkreise und Komponenten (Bauteile); Verstehen; Custom Integrated Circuits; Integrated Circuits; Resilient VLSI Circuits; Statistical process variations; Variation-Aware CAD; Variation-Aware Integrated Circuit Design; Variation-Tolerant Integrated Circuit Design; B; Circuits and Systems; Electronics and Microelectronics, Instrumentation; Nanotechnology and Microengineering; Electronic Circuits and Systems; Electronics and Microelectronics, Instrumentation; Microsystems and MEMS; Engineering; Elektronik; BB
This book targets custom IC designers who are encountering variation issues in their designs, especially for modern process nodes at 45nm and below, such as statistical process variations, environmental variations, and layout effects. The authors have created a field guide to show how to handle variation proactively, and to understand the benefits of doing so. Readers facing variation challenges in their memory, standard cell, analog/RF, and custom digital designs will find easy-to-read, pragmatic solutions. Reviews the most important concepts in variation-aware design, including types of variables and variation, useful variation-aware design terminology, and an overview and comparison of high-level design flows.Describes and compares a suite of approaches and flows for PVT corner-driven design and verification. Presents Fast PVT, a novel, confidence-driven global optimization technique for PVT corner extraction and verification that is both rapid and reliable.Presents a visually-oriented overview of probability density functions, Monte Carlo sampling, and yield estimation.Describes a suite of methods used for 2-3 sigma statistical design and presents a novel sigma-driven corners flow, which is a fast, accurate, and scalable method suitable for 2-3 sigma design and verification.Describes and compares high-sigma design and verification techniques and presents a novel technique for high-sigma statistical corner extraction and verification, demonstrating its fast, accurate, scalable, and verifiable qualities across a variety of applications.Compares manual design and automated sizing and introduces an integrated approach to aid the sizing step in PVT, 3σ statistical and high-sigma statistical design.Altri libri che potrebbero essere simili a questo:
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