ISBN: 9783540739944
Tis book concentrates on atomic force microscopy (AFM), a method recently - veloped to study the surfaces of synthetic polymeric membranes. AFM is becoming a very important tool for the c… Altro …
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ISBN: 9783540739944
; PDF; Scientific, Technical and Medical > Science: general issues > Scientific equipment, experiments & te, Peter Lang GmbH, Internationaler Verlag der Wissen
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ISBN: 9783540739944
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2007, ISBN: 9783540739944
Characterization by Atomic Force Microscopy, eBooks, eBook Download (PDF), Auflage, [PU: Springer-Verlag], [ED: 1], Springer-Verlag, 2007
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2007, ISBN: 9783540739944
Characterization by Atomic Force Microscopy, eBooks, eBook Download (PDF), 2008, [PU: Springer Berlin], Springer Berlin, 2007
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ISBN: 9783540739944
Tis book concentrates on atomic force microscopy (AFM), a method recently - veloped to study the surfaces of synthetic polymeric membranes. AFM is becoming a very important tool for the c… Altro …
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Synthetic Polymeric Membranes : Characterization by Atomic Force Microscopy - nuovo libroISBN: 9783540739944
; PDF; Scientific, Technical and Medical > Science: general issues > Scientific equipment, experiments & te, Peter Lang GmbH, Internationaler Verlag der Wissen
ISBN: 9783540739944
Synthetic Polymeric Membranes - Characterization by Atomic Force Microscopy: ab 96.49 € eBooks > Sachthemen & Ratgeber > Technik Springer-Verlag GmbH eBook als pdf, Springer-Verlag GmbH
2007, ISBN: 9783540739944
Characterization by Atomic Force Microscopy, eBooks, eBook Download (PDF), Auflage, [PU: Springer-Verlag], [ED: 1], Springer-Verlag, 2007
2007, ISBN: 9783540739944
Characterization by Atomic Force Microscopy, eBooks, eBook Download (PDF), 2008, [PU: Springer Berlin], Springer Berlin, 2007
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Informazioni dettagliate del libro - Synthetic Polymeric Membranes
EAN (ISBN-13): 9783540739944
ISBN (ISBN-10): 3540739947
Anno di pubblicazione: 2007
Editore: Springer-Verlag
198 Pagine
Lingua: eng/Englisch
Libro nella banca dati dal 2008-05-25T19:02:39+02:00 (Zurich)
Pagina di dettaglio ultima modifica in 2024-03-28T12:10:22+01:00 (Zurich)
ISBN/EAN: 9783540739944
ISBN - Stili di scrittura alternativi:
3-540-73994-7, 978-3-540-73994-4
Stili di scrittura alternativi e concetti di ricerca simili:
Autore del libro : feng, george lang, khul, peter george
Titolo del libro: microscopy, membranes
Dati dell'editore
Autore: K. C. Khulbe
Titolo: Springer Laboratory; Synthetic Polymeric Membranes - Characterization by Atomic Force Microscopy
Editore: Springer; Springer Berlin
198 Pagine
Anno di pubblicazione: 2007-12-03
Berlin; Heidelberg; DE
Lingua: Inglese
99,00 € (DE)
EA; E107; eBook; Nonbooks, PBS / Technik/Maschinenbau, Fertigungstechnik; Technische Anwendung von Polymeren und Verbundwerkstoffen; Verstehen; AFM; Atomic Force Microscopy; Helium-Atom-Streuung; Membranes; PED; Polymer; Polymers; Surfaces; morphology; C; Polymers; Humanities and Social Sciences; Industrial Chemistry; Biomedical Research; Analytical Chemistry; Food Science; Chemistry and Materials Science; Interdisziplinäre Studien; Industrielle Chemie und Chemietechnologie; Medizinische Forschung; Analytische Chemie; Lebensmittel- und Getränketechnologie; BB
Synthetic Membranes for Membrane Processes.- Atomic Force Microscopy.- Nodular Structure of Polymers in the Membrane.- Pore Size, Pore Size Distribution, and Roughness at the Membrane Surface.- Cross-sectional AFM Image.- Adhesion.- Membrane Surface Morphology and Membrane Performance.Altri libri che potrebbero essere simili a questo:
Ultimo libro simile:
9783642093272 Synthetic Polymeric Membranes (Khulbe, K. C.;Feng, C. Y.;Matsuura, Takeshi)
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