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Fringe 2013 : 7th International Workshop on Advanced Optical Imaging and Metrology - Wolfgang Osten
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Fringe 2013 : 7th International Workshop on Advanced Optical Imaging and Metrology - copertina rigida, flessible

2013, ISBN: 364236358X

[EAN: 9783642363580], Neubuch, [SC: 0.0], [PU: Springer Berlin Heidelberg], ADAPTIVEANDACTIVESOLUTIONSTRATEGIES; COMPRESSEDSENSING; COMPUTATIONALIMAGING; DIGITALWAVEFRONTENGINEERING; HYBR… Altro …

NEW BOOK. Costi di spedizione:Versandkostenfrei. (EUR 0.00) AHA-BUCH GmbH, Einbeck, Germany [51283250] [Rating: 5 (von 5)]
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Fringe 2013: 7th International Workshop on Advanced Optical Imaging and Metrology - copertina rigida, flessible

2013, ISBN: 9783642363580

Springer, Gebundene Ausgabe, Auflage: 2014, 1002 Seiten, Publiziert: 2013-08-29T00:00:01Z, Produktgruppe: Buch, Hersteller-Nr.: 700 black & white illustrations, 39.57 kg, Grafik & Multime… Altro …

Gut Costi di spedizione:Gewöhnlich versandfertig in 2 bis 3 Tagen. Die angegebenen Versandkosten können von den tatsächlichen Kosten abweichen. (EUR 3.00) MEDIMOPS
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Fringe 2013: 7th International Workshop on Advanced Optical Imaging and Metrology - copertina rigida, flessible

2013

ISBN: 9783642363580

Springer, Gebundene Ausgabe, Auflage: 2014, 1002 Seiten, Publiziert: 2013-08-29T00:00:01Z, Produktgruppe: Buch, Hersteller-Nr.: 700 black & white illustrations, 39.57 kg, Grafik & Multime… Altro …

Costi di spedizione:Die angegebenen Versandkosten können von den tatsächlichen Kosten abweichen. (EUR 3.00)
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Fringe 2013: 7th International Workshop on Advanced Optical Imaging and Metrology - copertina rigida, flessible

2013, ISBN: 364236358X

[EAN: 9783642363580], [SC: 0.0], [PU: Springer], Befriedigend/Good: Durchschnittlich erhaltenes Buch bzw. Schutzumschlag mit Gebrauchsspuren, aber vollständigen Seiten. / Describes the av… Altro …

Costi di spedizione:Versandkostenfrei. (EUR 0.00) medimops, Berlin, Germany [55410863] [Rating: 5 (von 5)]
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Fringe 2013 7th International Workshop on Advanced Optical Imaging and Metrology - Osten, Wolfgang
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Fringe 2013 7th International Workshop on Advanced Optical Imaging and Metrology - libri usati

2013, ISBN: 9783642363580

[PU: Springer Berlin], 24119320/1, DE, [SC: 0.00], gebraucht; sehr gut, gewerbliches Angebot, 2014, Banküberweisung, Kreditkarte, PayPal, Klarna-Sofortüberweisung, Internationaler Versand

Costi di spedizione:Versandkostenfrei, Versand nach Deutschland. (EUR 0.00) Buchpark GmbH

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Dettagli del libro
Fringe 2013: 7th International Workshop on Advanced Optical Imaging and Metrology

In continuation of the FRINGE Workshop Series this Proceeding contains all contributions presented at the 7. International Workshop on Advanced Optical Imaging and Metrology. The FRINGE Workshop Series is dedicated to the presentation, discussion and dissemination of recent results in Optical Imaging and Metrology. Topics of particular interest for the 7. Workshop are:
- New methods and tools for the generation, acquisition, processing, and evaluation of data in Optical Imaging and Metrology (digital wavefront engineering, computational imaging, model-based reconstruction, compressed sensing, inverse problems solution)
- Application-driven technologies in Optical Imaging and Metrology (high-resolution, adaptive, active, robust, reliable, flexible, in-line, real-time)
- High-dynamic range solutions in Optical Imaging and Metrology (from macro to nano)
- Hybrid technologies in Optical Imaging and Metrology
(hybrid optics, sensor and data fusion, model-based solutions, multimodality)
- New optical sensors, imaging and measurement systems
(integrated, miniaturized, in-line, real-time, traceable, remote)

Special emphasis is put on new strategies, taking into account the active combination of physical modeling, computer aided simulation and experimental data acquisition. In particular attention is directed towards new approaches for the extension of existing resolution limits that open the gates to wide-scale metrology, ranging from macro to nano, by considering dynamic changes and using advanced optical imaging and sensor systems.

Informazioni dettagliate del libro - Fringe 2013: 7th International Workshop on Advanced Optical Imaging and Metrology


EAN (ISBN-13): 9783642363580
ISBN (ISBN-10): 364236358X
Copertina rigida
Copertina flessibile
Anno di pubblicazione: 2013
Editore: Osten, Wolfgang, Springer

Libro nella banca dati dal 2014-05-10T18:55:41+02:00 (Zurich)
Pagina di dettaglio ultima modifica in 2023-10-06T23:31:38+02:00 (Zurich)
ISBN/EAN: 9783642363580

ISBN - Stili di scrittura alternativi:
3-642-36358-X, 978-3-642-36358-0
Stili di scrittura alternativi e concetti di ricerca simili:
Autore del libro : ost, osten
Titolo del libro: frings, fringe


Dati dell'editore

Autore: Wolfgang Osten
Titolo: Fringe 2013 - 7th International Workshop on Advanced Optical Imaging and Metrology
Editore: Springer; Springer Berlin
976 Pagine
Anno di pubblicazione: 2013-08-29
Berlin; Heidelberg; DE
Stampato / Fatto in
Lingua: Inglese
320,99 € (DE)
329,99 € (AT)
354,00 CHF (CH)
POD
XXVI, 976 p. 620 illus.

BB; Hardcover, Softcover / Physik, Astronomie; Sicherheitssysteme und Brandmeldeanlagen; Verstehen; Ingenieurwissenschaften; Adaptive and Active Solution Strategies; Compressed Sensing; Computational Imaging; Digital Wavefront Engineering; Hybrid Optics; In-line Performance; Integration; Inverse-Problems Solution; Miniaturization; Model-Based Reconstruction Technologies; Model-Based Solutions; Multimodality; Real-Time Performance; Remote Technology; Resolution-Enhanced Technologies; Sensor and Data Fusion; Traceability; quality control, reliability, safety and risk; Security Science and Technology; Laser; Signal, Speech and Image Processing; Computer Vision; Laserphysik; Elektronik; Digitale Signalverarbeitung (DSP); Maschinelles Sehen, Bildverstehen; EA; BC

Special emphasis is put on new strategies, taking into account the active combination of physical modeling, computer aided simulation and experimental data acquisition. In particular attention is directed towards new approaches for the extension of existing resolution limits that open the gates to wide-scale metrology, ranging from macro to nano, by considering dynamic changes and using advanced optical imaging and sensor systems.
A comprehensive overview about the state of the art in modern optical imaging and metrology Written by the world leading experts in the field Combination of two disciplines: metrology and imaging

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