Insulating Films on Semiconductors : Proceedings of the Second International Conference, INFOS 81, Erlangen, Fed. Rep. of Germany, April 27¿29, 1981 - edizione con copertina flessibile
2012, ISBN: 3642682499
[EAN: 9783642682490], Neubuch, [SC: 0.0], [PU: Springer Berlin Heidelberg], HALBLEITER; ISOLIERENDEDÜNNESCHICHT; LASER; SEMICONDUCTOR; SILICON; THINFILMS, Druck auf Anfrage Neuware - Prin… Altro …
ZVAB.com AHA-BUCH GmbH, Einbeck, Germany [51283250] [Rating: 5 (von 5)] NEW BOOK. Costi di spedizione:Versandkostenfrei. (EUR 0.00) Details... |
2012, ISBN: 3642682499
[EAN: 9783642682490], Neubuch, [PU: Springer Berlin Heidelberg Jan 2012], HALBLEITER; ISOLIERENDEDÜNNESCHICHT; LASER; SEMICONDUCTOR; SILICON; THINFILMS, This item is printed on demand - i… Altro …
AbeBooks.de BuchWeltWeit Inh. Ludwig Meier e.K., Bergisch Gladbach, Germany [57449362] [Rating: 5 (von 5)] NEW BOOK. Costi di spedizione: EUR 7.16 Details... |
ISBN: 9783642682490
The INFOS 81 Conference on Insulating Films on Semiconductors was held at the University of Erlangen-NUrnberg in Erlangen from 27 to 29 April 1981. This conference was a sequel to the fir… Altro …
Indigo.ca new in stock. Costi di spedizione:zzgl. Versandkosten., Costi di spedizione aggiuntivi Details... |
Insulating Films on Semiconductors Proceedings of the Second International Conference, INFOS 81, Erlangen, Fed. Rep. of Germany, April 27¿29, 1981 - edizione con copertina flessibile
2012, ISBN: 3642682499
Softcover reprint of the original 1st ed. 1981 Kartoniert / Broschiert Halbleiter; IsolierendedünneSchicht; Laser; Semiconductor; Silicon; thinfilms, mit Schutzumschlag 11, [PU:Springer… Altro …
Achtung-Buecher.de MARZIES.de Buch- und Medienhandel, 14621 Schönwalde-Glien Costi di spedizione:Versandkostenfrei innerhalb der BRD. (EUR 0.00) Details... |
Insulating Films on Semiconductors: Proceedings of the Second International Conference, Infos 81, Erlangen, Fed. Rep. of Germany, April 27 - 29 1981 - edizione con copertina flessibile
2012, ISBN: 3642682499
[EAN: 9783642682490], Neubuch, [PU: Springer], reprint edition. 332 pages. 9.25x6.10x0.80 inches. In Stock., Books
AbeBooks.de Revaluation Books, Exeter, United Kingdom [2134736] [Rating: 5 (von 5)] NEW BOOK. Costi di spedizione: EUR 11.61 Details... |
Insulating Films on Semiconductors : Proceedings of the Second International Conference, INFOS 81, Erlangen, Fed. Rep. of Germany, April 27¿29, 1981 - edizione con copertina flessibile
2012, ISBN: 3642682499
[EAN: 9783642682490], Neubuch, [SC: 0.0], [PU: Springer Berlin Heidelberg], HALBLEITER; ISOLIERENDEDÜNNESCHICHT; LASER; SEMICONDUCTOR; SILICON; THINFILMS, Druck auf Anfrage Neuware - Prin… Altro …
2012, ISBN: 3642682499
[EAN: 9783642682490], Neubuch, [PU: Springer Berlin Heidelberg Jan 2012], HALBLEITER; ISOLIERENDEDÜNNESCHICHT; LASER; SEMICONDUCTOR; SILICON; THINFILMS, This item is printed on demand - i… Altro …
ISBN: 9783642682490
The INFOS 81 Conference on Insulating Films on Semiconductors was held at the University of Erlangen-NUrnberg in Erlangen from 27 to 29 April 1981. This conference was a sequel to the fir… Altro …
Insulating Films on Semiconductors Proceedings of the Second International Conference, INFOS 81, Erlangen, Fed. Rep. of Germany, April 27¿29, 1981 - edizione con copertina flessibile
2012, ISBN: 3642682499
Softcover reprint of the original 1st ed. 1981 Kartoniert / Broschiert Halbleiter; IsolierendedünneSchicht; Laser; Semiconductor; Silicon; thinfilms, mit Schutzumschlag 11, [PU:Springer… Altro …
Insulating Films on Semiconductors: Proceedings of the Second International Conference, Infos 81, Erlangen, Fed. Rep. of Germany, April 27 - 29 1981 - edizione con copertina flessibile
2012, ISBN: 3642682499
[EAN: 9783642682490], Neubuch, [PU: Springer], reprint edition. 332 pages. 9.25x6.10x0.80 inches. In Stock., Books
Dati bibliografici del miglior libro corrispondente
Autore: | |
Titolo: | |
ISBN: |
Informazioni dettagliate del libro - Insulating Films on Semiconductors by M. Schulz Paperback | Indigo Chapters
EAN (ISBN-13): 9783642682490
ISBN (ISBN-10): 3642682499
Copertina flessibile
Anno di pubblicazione: 2012
Editore: M. Schulz
Libro nella banca dati dal 2014-02-11T18:58:27+01:00 (Zurich)
Pagina di dettaglio ultima modifica in 2023-10-19T13:41:34+02:00 (Zurich)
ISBN/EAN: 9783642682490
ISBN - Stili di scrittura alternativi:
3-642-68249-9, 978-3-642-68249-0
Stili di scrittura alternativi e concetti di ricerca simili:
Autore del libro : schulz von, penß, nürnberg
Titolo del libro: 1981, semiconductors, springer, erlangen 1890 1960
Dati dell'editore
Autore: M. Schulz; G. Pensl
Titolo: Springer Series in Electronics and Photonics; Insulating Films on Semiconductors - Proceedings of the Second International Conference, INFOS 81, Erlangen, Fed. Rep. of Germany, April 27–29, 1981
Editore: Springer; Springer Berlin
318 Pagine
Anno di pubblicazione: 2012-01-19
Berlin; Heidelberg; DE
Stampato / Fatto in
Lingua: Inglese
106,99 € (DE)
109,99 € (AT)
118,00 CHF (CH)
POD
X, 318 p.
BC; Hardcover, Softcover / Technik/Maschinenbau, Fertigungstechnik; Materialwissenschaft; Verstehen; Halbleiter; Isolierende dünne Schicht; laser; semiconductor; silicon; thin films; Surfaces, Interfaces and Thin Film; BB
I Si-SiO2 Interface.- Electronic Structure of the Si-SiO2 Interface.- Morphology of the Si-SiO2 Interface.- Influence of Oxidation Parameters on Atomic Roughness at the Si-SiO2 Interface.- Electronic and Optical Properties of SiOX.- Hydrogenation of Defects at the Si-SiO2 Interface.- Stress Behaviour of Hydrogen Annealed Interface States.- On the Si/SiO2 Interface Recombination Velocity.- Optical Excitation of MOS-Interface-States.- II Thin Insulating Films.- Langmuir-Blodgett Films on Semiconductors.- A Study of MIS Structures Prepared Under U1tra-High-Vacuum Conditions.- Electrical Properties of Ultrathin Oxide Layers Formed by DC Plasma Anodization.- Influence of Different Technologies of Metal Deposition and of Oxide Growth on the Electronic Properties of MIS Tunnel Diodes.- Photoelectric Methods as a Tool for the Analysis of Current Flow Mechanism in MIS Tunnel Diodes.- III Charge Injection Into Insulators.- Charge Injection Into Wide Energy Band-Gap Insulators.- Oxide and Interface Charge Generation by Electron Injection in MOS Devices.- Trapping Characteristics in SiO2.- Interface Effects in Avalanche Injection of Electrons into Silicon Dioxide.- Interface State and Charge Generation by Electron Tunneling into Thin Layers of SiO2.- Modelling of Flat-Band Voltage Shift During Avalanche Injection on MOS Capacitors.- Influence of Electron-Phonon Scattering on Photoinjection Into SiO2.- IV Multilayer Structures.- Charge Loss in MANOS Memory Structures.- Surface-State Density Evaluation Problems in MNOS Structures.- Dye-Sensitized Photodischarge of Metal-Dye-Oxide-Silicon (MDOS) and Metal-Dye-Nitride-Oxide-Silicon (MDNOS) Capacitors.- V Interface Characterization Techniques.- EPR on MOS Interface States.- The Non-Equilibrium Linear Voltage Ramp Technique as a Diagnostic Tool for the MOS Structure.- MOS Characterization by Phase Shift Impedance Technique.- Si/SiO2 Properties Investigated by the CC-DLTS Method.- Study of Ellipsometry: The Computation of Ellipsometric Parameters in a Nonuniform Film on Solid Substrate.- VI Breakdown and Instability of the SiO2-Si System.- Breakdown and Wearout Phenomena in SiO2.- Hydrogen-Sodium Interactions in Pd-MOS Devices.- Electrical Behaviour of Hydrogen Ions in SiO2 Films on Silicon.- Chlorine Implantation in Thermal SiO2.- VII Technology.- Deposition Technology of Insulating Films.- Very High Charge Densities in Silicon Nitride Films on Silicon for Inversion Layer Solar Cells.- Silicon Nitride Layers Grown by Plasma Enhanced Thermal Nitridation.- Buried Oxide Layers Formed by Oxygen Implantation for Potential Use in Dielectrically Isolated ICs.- VIII Laser Processing.- Properties of Patterned and CW Laser-Crystallized Silicon Films on Amorphous Substrates.- SiO2 Interface Degradation and Minority Carrier Lifetime Effects of Laser Beam Processing.- Laser-Induced Crystallization in Ge Films and Multilayered Al-Sb Films.- IX Transport Properties in Inversion Layers.- Subband Physics with Real Interfaces.- Transport Properties of Carriers at Oxide-Hg1?xCdx Te Interface.- Role of Interface States in Electron Scattering at Low Temperatures.- Neutral Scattering Centers Near the Si/SiO2-Interface of MOSFET Devices Prepared by TCE Oxidation.- X Films on Compound Semiconductors.- Native Oxide Reactions on III-V Compound Semiconductors.- MISFET and MIS Diode Behaviour of Some Insulator-InP Systems.- Plasma Anodised Alumina Films in GaAs and InP MIS Structures.- Composition Changes During Oxidation of AIIIBV Surfaces.- RF-Sputtering of Silicon Nitride Layers on GaAs Substrates: Characterization of anIntermediate Layer Between the Substrate and the Deposited Film.- Surface Analytical and Capacitance-Voltage Characterization of Anodic Oxide Films on Hg0.8Cd0.2Te.- Surface and In-Depth Analysis of Anodic Oxide-Layers on Cd0.2Hg0.8Te.- Impact of Insulator Charge Trapping on I.R.C.I.D. Transfer Efficiency.- Index of Contributors.Altri libri che potrebbero essere simili a questo:
Ultimo libro simile:
9783642682476 Insulating Films on Semiconductors (M. Schulz; G. Pensl)
- 9783642682476 Insulating Films on Semiconductors (M. Schulz; G. Pensl)
- 9780444867353 Insulating Films on Semiconductors 1983: International Conference Proceedings (Editor-J. F. Verweij; Editor-D. R. Wolters)
- 9783540110217 Insulating Films on Semiconductors: Proceedings of the Second International Conference, INFOS 81, Erlangen, Fed. Rep. of Germany, April 27?29, 1981 ... in Electronics and Photonics, 7, Band 7) (Schulz, Max and G. Pensl)
- 9780444878724 Insulating Films on Semiconductors 1985: International Conference Proceedings (Editor-J.J. Simonne; Editor-J. Buxo)
< Per archiviare...