2010, ISBN: 9789048144068
Springer, Taschenbuch, Auflage: Softcover reprint of hardcover 1st ed. 1994, 500 Seiten, Publiziert: 2010-12-07T00:00:01Z, Produktgruppe: Buch, 1.53 kg, Maschinenbau, Ingenieurwissenschaf… Altro …
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2010, ISBN: 904814406X
[EAN: 9789048144068], New book, [SC: 15.23], [PU: Springer Netherlands], ADSORPTION EXAFS LEED PAS STEM X-RAYSCATTERING CRYSTAL DIFFRACTION MORPHOLOGY SPECTROSCOPY CHEMIE PHYSIKALISCHE X-… Altro …
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2010, ISBN: 9789048144068
Editor: Melendres, C.A. Editor: Tadjeddine, A. Springer, Paperback, Auflage: Softcover reprint of hardcover 1st ed. 1994, 498 Seiten, Publiziert: 2010-12-07T00:00:01Z, Produktgruppe: Book… Altro …
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ISBN: 9789048144068
Springer Netherlands, 1994. Paperback. New. 500 pages. 9.25x6.10x1.13 inches., Springer Netherlands, 1994, 6
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2010, ISBN: 904814406X
[EAN: 9789048144068], New book, [SC: 4.92], [PU: Springer], Books
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Synchrotron Techniques in Interfacial Electrochemistry (Nato Science Series C: (Closed)) (Nato Science Series C:, 432, Band 432) - edizione con copertina flessibile
2010, ISBN: 9789048144068
Springer, Taschenbuch, Auflage: Softcover reprint of hardcover 1st ed. 1994, 500 Seiten, Publiziert: 2010-12-07T00:00:01Z, Produktgruppe: Buch, 1.53 kg, Maschinenbau, Ingenieurwissenschaf… Altro …
Melendres, C. A.|Tadjeddine, A.:
Synchrotron Techniques in Interfacial Electrochemistry - edizione con copertina flessibile2010, ISBN: 904814406X
[EAN: 9789048144068], New book, [SC: 15.23], [PU: Springer Netherlands], ADSORPTION EXAFS LEED PAS STEM X-RAYSCATTERING CRYSTAL DIFFRACTION MORPHOLOGY SPECTROSCOPY CHEMIE PHYSIKALISCHE X-… Altro …
2010
ISBN: 9789048144068
Editor: Melendres, C.A. Editor: Tadjeddine, A. Springer, Paperback, Auflage: Softcover reprint of hardcover 1st ed. 1994, 498 Seiten, Publiziert: 2010-12-07T00:00:01Z, Produktgruppe: Book… Altro …
ISBN: 9789048144068
Springer Netherlands, 1994. Paperback. New. 500 pages. 9.25x6.10x1.13 inches., Springer Netherlands, 1994, 6
2010, ISBN: 904814406X
[EAN: 9789048144068], New book, [SC: 4.92], [PU: Springer], Books
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Informazioni dettagliate del libro - Synchrotron Techniques in Interfacial Electrochemistry (Nato Science Series C:, 432)
EAN (ISBN-13): 9789048144068
ISBN (ISBN-10): 904814406X
Copertina rigida
Copertina flessibile
Anno di pubblicazione: 2010
Editore: Springer
500 Pagine
Peso: 0,748 kg
Lingua: eng/Englisch
Libro nella banca dati dal 2011-01-08T14:13:27+01:00 (Zurich)
Pagina di dettaglio ultima modifica in 2023-11-22T23:55:31+01:00 (Zurich)
ISBN/EAN: 9789048144068
ISBN - Stili di scrittura alternativi:
90-481-4406-X, 978-90-481-4406-8
Stili di scrittura alternativi e concetti di ricerca simili:
Autore del libro : melendres
Titolo del libro: electrochemistry
Dati dell'editore
Autore: C.A. Melendres; A. Tadjeddine
Titolo: Nato Science Series C:; Synchrotron Techniques in Interfacial Electrochemistry
Editore: Springer; Springer Netherland
480 Pagine
Anno di pubblicazione: 2010-12-07
Dordrecht; NL
Stampato / Fatto in
Lingua: Inglese
320,99 € (DE)
329,99 € (AT)
354,00 CHF (CH)
POD
XVIII, 480 p.
BC; Hardcover, Softcover / Chemie/Physikalische Chemie; Elektrochemie und Magnetochemie; Verstehen; Adsorption; EXAFS; LEED; PAS; STEM; X-ray scattering; crystal; diffraction; electrochemistry; morphology; spectroscopy; Electrochemistry; Physical Chemistry; Surfaces, Interfaces and Thin Film; Measurement Science and Instrumentation; Characterization and Analytical Technique; Physikalische Chemie; Materialwissenschaft; Wissenschaftliche Standards, Normung usw. Werkstoffprüfung; BB; EA
Synchrotron Radiation and Instrumentation.- The Electrode/Solution Interphase: Problems for Synchrotron Radiation.- Nature of Surface Films.- Theory of the X-ray Scattering from Surfaces and Interfaces.- X-ray Diffuse Scattering as a Probe for thin Film and Interface Structure.- Surface Morphology Characterization with X-ray Scattering Techniques.- Studies of Electrodes by In-Situ X-ray Scattering.- Surface Structure of the Au (111) Electrode.- In Situ X-ray Diffraction Studies of the Electrodeposition of Pb Monolayers on Au(100) Single Crystals.- Oxidation of Mo(001) Surfaces.- Extended X-ray Absorption Fine Structure: Physical Principles and Data Analysis.- The Use of X-ray Techniques in the In-Situ Study of Corrosion.- In Situ X-ray Absorption Spectroscopy Investigation of UPD Metal Monolayers.- In Situ X-ray Absorption Spectroscopy of Nickel Oxide Electrodes.- The UPD of Copper on Pt (100) In-Situ EXAFS and Ex Situ Structural LEED Investigations.- Characterization of New Systems for the Catalytic Electroreduction of Oxygen by Electrochemistry and X-ray Absorption Spectroscopy.- In Situ and Ex Situ Examination of Passivating Cu2O Layers with EXAFS and REFLEXAFS.- In-Situ and Ex-Situ Spectroelectrochemical and X-ray Absorption Studies on Rechargeable, Chemically-Modified and other MnO2 Materials.- EXAFS Studies of Film Coated Electrodes.- Electrode-Electrolyte Interfaces Investigated with X-ray Standing Waves: Cu(III)/Pb, Ti.- X-ray Standing Wave Studies of Underpotentially Deposited Metal Monolayers.- The Application of Infrared Synchrotron Radiation to the Study of Interfacial Vibrational Modes.- Fourier Transform Infrared Combined with Synchrotron Radiation for Probing the Electrochemical Interface.- Far Infrared Synchrotron Radiation and the Electrochemical Interface.- The Adsorption of CO and H2O on Polycrystalline Gold as Studied by Synchrotron Infrared Spectroscopy.- Layered Semiconductor/Electrolyte Model Interfaces Investigated in UHV by Synchrotron Induced Photoelectron Spectroscopy.- Future Prospects for the Application of Synchrotron Techniques to Interfacial Electrochemistry.Altri libri che potrebbero essere simili a questo:
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