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Functional Design Errors in Digital Circuits Diagnosis Correction and Repair - Kai-Hui Chang, Valeria Bertacco, Igor L. Markov
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2010, ISBN: 9789048181124

Kartoniert, 224 Seiten, 235mm x 155mm x 13mm, Sprache(n): eng Coverage of novel techniques to automate IC debugging, a subject rarely covered in other books Comprehensive scope and solu… Altro …

Costi di spedizione:Versandkostenfrei innerhalb der BRD. (EUR 0.00) MARZIES Buch- und Medienhandel, 14621 Schönwalde-Glien
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Functional Design Errors in Digital Circuits by Kai-hui Chang Paperback | Indigo Chapters
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ISBN: 9789048181124

Functional Design Errors in Digital Circuits Diagnosiscovers a wide spectrum of innovative methods to automate the debugging process throughout the design flow: from Register-Transfer Lev… Altro …

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Functional Design Errors in Digital Circuits: Diagnosis Correction and Repair (Lecture Notes in Electrical Engineering, Band 32) - Chang, Kai-hui
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Functional Design Errors in Digital Circuits: Diagnosis Correction and Repair (Lecture Notes in Electrical Engineering, Band 32) - edizione con copertina flessibile

2010

ISBN: 9789048181124

Mitwirkende: Markov, Igor L. Mitwirkende: Bertacco, Valeria, Springer, Taschenbuch, Auflage: Softcover reprint of hardcover 1st ed. 2009, 224 Seiten, Publiziert: 2010-10-28T00:00:01Z, Pro… Altro …

Costi di spedizione:Gewöhnlich versandfertig in 6 bis 7 Tagen. Die angegebenen Versandkosten können von den tatsächlichen Kosten abweichen. (EUR 3.00) preigu
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Functional Design Errors in Digital Circuits Diagnosis Correction and Repair - Chang, Kai-Hui; Bertacco, Valeria; Markov, Igor L.
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Functional Design Errors in Digital Circuits Diagnosis Correction and Repair - edizione con copertina flessibile

2010, ISBN: 9048181127

edizione con copertina rigida

Softcover reprint of hardcover 1st ed. 2009 Kartoniert / Broschiert Computer-Aided Design (CAD), Rechnerarchitektur und Logik-Entwurf, Automaticdebugging; Errordiagnosis; Errorrepair; P… Altro …

Costi di spedizione:Versandkostenfrei innerhalb der BRD. (EUR 0.00) MARZIES.de Buch- und Medienhandel, 14621 Schönwalde-Glien
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Functional Design Errors in Digital Circuits - Valeria Bertacco/ Kai-Hui Chang/ Igor L. Markov
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Functional Design Errors in Digital Circuits - edizione con copertina flessibile

2009, ISBN: 9048181127

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Functional Design Errors in Digital Circuits ab 149.99 € als Taschenbuch: Diagnosis Correction and Repair. Softcover reprint of hardcover 1st ed. 2009. Aus dem Bereich: Bücher, Taschenbüc… Altro …

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Dettagli del libro
Functional Design Errors in Digital Circuits: Diagnosis Correction and Repair (Lecture Notes in Electrical Engineering, Band 32)

Functional Design Errors in Digital Circuits Diagnosis covers a wide spectrum of innovative methods to automate the debugging process throughout the design flow: from Register-Transfer Level (RTL) all the way to the silicon die. In particular, this book describes: (1) techniques for bug trace minimization that simplify debugging; (2) an RTL error diagnosis method that identifies the root cause of errors directly; (3) a counterexample-guided error-repair framework to automatically fix errors in gate-level and RTL designs; (4) a symmetry-based rewiring technology for fixing electrical errors; (5) an incremental verification system for physical synthesis; and (6) an integrated framework for post-silicon debugging and layout repair. The solutions provided in this book can greatly reduce debugging effort, enhance design quality, and ultimately enable the design and manufacture of more reliable electronic devices.

Informazioni dettagliate del libro - Functional Design Errors in Digital Circuits: Diagnosis Correction and Repair (Lecture Notes in Electrical Engineering, Band 32)


EAN (ISBN-13): 9789048181124
ISBN (ISBN-10): 9048181127
Copertina rigida
Copertina flessibile
Anno di pubblicazione: 2010
Editore: Springer
224 Pagine
Peso: 0,345 kg
Lingua: eng/Englisch

Libro nella banca dati dal 2011-04-08T00:51:00+02:00 (Zurich)
Pagina di dettaglio ultima modifica in 2023-11-16T22:13:08+01:00 (Zurich)
ISBN/EAN: 9789048181124

ISBN - Stili di scrittura alternativi:
90-481-8112-7, 978-90-481-8112-4
Stili di scrittura alternativi e concetti di ricerca simili:
Autore del libro : markov, chang, hui kai
Titolo del libro: error design, function circuits, electrical engineering, hui kai


Dati dell'editore

Autore: Kai-hui Chang; Igor L. Markov; Valeria Bertacco
Titolo: Lecture Notes in Electrical Engineering; Functional Design Errors in Digital Circuits - Diagnosis Correction and Repair
Editore: Springer; Springer Netherland
200 Pagine
Anno di pubblicazione: 2010-10-28
Dordrecht; NL
Stampato / Fatto in
Lingua: Inglese
160,49 € (DE)
164,99 € (AT)
177,00 CHF (CH)
POD
XXIV, 200 p.

BC; Hardcover, Softcover / Technik/Elektronik, Elektrotechnik, Nachrichtentechnik; Schaltkreise und Komponenten (Bauteile); Verstehen; Automatic debugging; Error diagnosis; Error repair; Post-silicon debugging; algorithms; circuit design; formal verification; integrated circuit; layout; simulation; verification; Electronic Circuits and Systems; Computer-Aided Engineering (CAD, CAE) and Design; Logic Design; Computer-Aided Design (CAD); Rechnerarchitektur und Logik-Entwurf; BB; EA

Background and Prior Art.- Current Landscape in Design and Verification.- Finding Bugs and Repairing Circuits.- FogClear Methodologies and Theoretical Advances in Error Repair.- Circuit Design and Verification Methodologies.- Counterexample-Guided Error-Repair Framework.- Signature-Based Resynthesis Techniques.- Symmetry-Based Rewiring.- FogClear Components.- Bug Trace Minimization.- Functional Error Diagnosis and Correction.- Incremental Verification for Physical Synthesis.- Post-Silicon Debugging and Layout Repair.- Methodologies for Spare-Cell Insertion.- Conclusions.
Coverage of novel techniques to automate IC debugging, a subject rarely covered in other books Comprehensive scope and solutions: from RTL to post-silicon debugging The innovative techniques covered in this book are recent and have been featured by MIT Technology Review, EE Times, SCD Source, IEEE Computer, and other sources First empirical comparison of several methods for spare-cell insertion A variety of examples and figures to illustrate key concepts and algorithms

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